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Semiconductor Power Devices Physics, Characteristics, Reliability-[1]-[2011]-[pdf]-[Josef Lutz, Heinrich Schlangenotto, Uwe Scheuermann, Rik De Doncker (auth.)]

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发表于 2019-12-10 21:13:47 | 显示全部楼层 |阅读模式
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书籍信息:
语言: English
格式: pdf
大小: 12.4M
年份: 2011
作者: Josef Lutz, Heinrich Schlangenotto, Uwe Scheuermann, Rik De Doncker (auth.)
版次: 1
出版社: Springer-Verlag Berlin Heidelberg

简介

Semiconductor power devices are the heart of power electronics. They determine the performance of power converters and allow topologies with high efficiency. Semiconductor properties, pn-junctions and the physical phenomena for understanding power devices are discussed in depth. Working principles of state-of-the-art power diodes, thyristors, MOSFETs and IGBTs are explained in detail, as well as key aspects of semiconductor device production technology. In practice, not only the semiconductor, but also the thermal and mechanical properties of packaging and interconnection technologies are essential to predict device behavior in circuits. Wear and aging mechanisms are identified and reliability analyses principles are developed. Unique information on destructive mechanisms, including typical failure pictures, allows assessment of the ruggedness of power devices. Also parasitic effects, such as device induced electromagnetic interference problems, are addressed. The book concludes with modern power electronic system integration techniques and trends.



目录
Front Matter....Pages i-xii
Power Semiconductor Devices – Key Components for Efficient Electrical Energy Conversion Systems....Pages 1-15
Semiconductor Properties....Pages 17-75
pn-Junctions....Pages 77-121
Short Introduction to Power Device Technology....Pages 123-157
pin-Diodes....Pages 159-224
Schottky Diodes....Pages 225-240
Bipolar Transistors....Pages 241-256
Thyristors....Pages 257-282
MOS Transistors....Pages 283-314
IGBTs....Pages 315-342
Packaging and Reliability of Power Devices....Pages 343-418
Destructive Mechanisms in Power Devices....Pages 419-473
Power Device-Induced Oscillations and Electromagnetic Disturbances....Pages 475-495
Power Electronic Systems....Pages 497-513
Back Matter....Pages 515-536

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